Differential interference metallographic microscope SGO-5232 is mainly used for display screen guidance

Particle detection, metal detection, analysis, chip semiconductor detection, coating detection,

Powder detection, equipped with a polarized optical system, with the highest optical magnification in the DIC section

Up to 400 times, there are multiple options for image acquisition systems: 4K high-definition imaging system

Unified, USB 3.0 computer version imaging system, ultra depth of field fusion imaging system

High precision measurement imaging system, metallographic analysis imaging system, etc.